Umberto Celano
Metrology and Physical Mechanisms in New Generation Ionic Devices
Gebonden Engels 2016 9783319395302
Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
Specificaties
ISBN13:9783319395302
Taal:Engels
Bindwijze:gebonden
Uitgever:Springer International Publishing
Serie:Springer Theses
Lezersrecensies
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Inhoudsopgave
Introduction.- Filamentary-Based Resistive Switching.- Nanoscaled Electrical Characterization.- Conductive Filaments: Formation, Observation and Manipulation.- Three-Dimensional Filament Observation.- Reliability Threats in CBRAM.- Conclusions and Outlook.
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