Advanced Characterization Techniques for Thin Film Solar Cells 2e

PART I. Introduction
<br />
<br /> INTRODUCTION TO THIN–FILM PHOTOVOLTAICS
<br /> Introduction
<br /> The Photovoltaic Principle
<br /> Functional Layers in Thin–Film Solar Cells
<br /> Comjparison of Various Thin–Film Solar–Cell Types
<br /> Conclusions
<br />
<br /> PART II. Device Characterization
<br />
<br /> FUNDAMENTAL ELECTRICAL CHARACTERIZATIONS OF THIN–FILM SOLAR CELLS
<br /> Introduction
<br /> Current/Voltage Curves
<br /> Quantum–Efficiency Measurements
<br />
<br /> ELECTROLUMINESCENCE ANALYSIS OF SOLAR CELLS AND SOLAR MODULES
<br /> Introduction
<br /> Basics
<br /> Spectrally Resolved EL
<br /> Spatially Resolved EL of c–Si Solar Cells
<br /> EL Imaging of Thin–Film Solar Cells and Modules
<br /> Electromodulated Luminescence under Illumination
<br />
<br /> CAPACITANCE SPECTROSCOPY OF THIN–FILM SOLAR CELLS
<br /> Introduction
<br /> Admittance Basics
<br /> Sample Requirements
<br /> Instrumentation
<br /> CV Profiling and the Depletion Approximation
<br /> Admittance Response of Deep States
<br /> The Influence of Deep States on CV Profiles
<br /> Deep–Level Transient Spectroscopy
<br /> Admittance Spectroscopy
<br /> Drive–Level Capacitance Profiling
<br /> Photocapacitance
<br /> The Meyer–Neldel Rule
<br /> Spatial Inhomogeneities and Interface States
<br /> Metastability
<br />
<br /> TIME–OF–FLIGHT ANALYSIS
<br /> Introduction
<br /> Fundamentals of TOF Measurements
<br /> Experimental Details
<br /> Analysis of TOF Results
<br />
<br /> TRANSIENT OPTOELECTRONIC CHARACTERIZATION OF THIN–FILM SOLAR CELLS
<br /> Introduction
<br /> Measurement Setup
<br /> Charge Extraction and Transient Photovoltage
<br /> CE with Linearly Increased Voltage
<br /> Time–Delayed Collection Field Method
<br />
<br /> STEADY–STATE PHOTOCARRIER GRATING METHOD
<br /> Introduction
<br /> Basic Analysis of SSPG and Photocurrent Response
<br /> Experimental Setup
<br /> Data Analysis
<br /> Results
<br /> DOS Determination
<br /> Data Collection by Automization and Combination with other Experiments
<br /> Summary
<br />
<br /> PART III. Materials Characterization
<br />
<br /> ABSORPTION AND PHOTOCURRENT SPECTROSCOPY WITH HIGH DYNAMIC RANGE
<br /> Introduction
<br /> Photothermal Deflection Spectroscopy
<br /> Fourier Transform Photocurrent Spectroscopy
<br />
<br /> SPECTROSCOPIC ELLIPSOMETRY
<br /> Introduction
<br /> Theory
<br /> Ellipsometry Instrumentation
<br /> Data Analysis
<br /> Spectroscopic Ellipsometry forThin–Film Photovoltaics
<br /> Summary and Outlook
<br />
<br /> CHARACTERIZING THE LIGHT–TRAPPING PROPERTIES OF TEXTURED SURFACES WITH SCANNING NEAR–FIELD OPTICAL MICROSCOPY
<br /> Introduction
<br /> How Does a Scanning Near–Field Optical Microscope Work?
<br /> The Role of Evanescent Modes for Light Trapping
<br /> Analysis of Scanning Near–Field Optical Microscopy Images by Fast Fourier Transformation
<br /> Investigation of Individua lWaveguide Modes
<br /> Light Propagation inThin–Film Solar Cells Investigated with Dual–Probe SNOM
<br /> Conclusion
<br />
<br /> PHOTOLUMINESCENCE ANALYSIS OF THIN–FILM SOLAR CELLS
<br /> Introduction
<br /> Experimental Issues
<br /> Basic Transitions
<br /> Case Studies
<br />
<br /> ELECTRON–SPIN RESONANCE (ESR) IN HYDROGENATED AMORPHOUS SILICON (a–Si:H)
<br /> Introduction
<br /> Basics of ESR
<br /> How to Measure ESR
<br /> The g Tensor and Hyperfine Interaction in Disordered Solids
<br /> Discussion of Selected Results
<br /> Alternative ESR Detection
<br /> Concluding Remarks
<br />
<br /> SCANNING PROBE MICROSCOPY ON INORGANIC THIN FILMS FOR SOLAR CELLS
<br /> Introduction
<br /> Experimental Background
<br /> Selected Applications
<br /> Summary
<br />
<br /> ELECTRON MICROSCOPY ON THIN FILMS FOR SOLAR CELLS
<br /> Introduction
<br /> Scanning Electron Microscopy
<br /> Transmission Electron Microscopy
<br /> Sample Preparation Techniques
<br />
<br /> X–RAY AND NEUTRON DIFFRACTION ON MATERIALS FOR THIN–FILM SOLAR CELLS
<br /> Introduction
<br /> Diffraction of X–Rays and Neutron by Matter
<br /> Grazing Incidence X–Ray Diffraction (GIXRD)
<br /> Neutron Diffraction of Absorber Materials for Thin–Film Solar Cells
<br /> Anomalous Scattering of Synchrotron X–Rays
<br />
<br /> IN SITU REAL–TIME CHARACTERIZATION OF THIN–FILM GROWTH
<br /> Introduction
<br /> Real–Time In Situ Characterization Techniques for Thin–Film Growth
<br /> X–Ray Methods for Real–Time Growth Analysis
<br /> Light Scattering and Reflection
<br /> Summary
<br />
<br /> RAMAN–SPECTROSCOPY ON THIN FILMS FOR SOLAR CELLS
<br /> Introduction
<br /> Fundamentals of Raman Spectroscopy
<br /> Vibrational Modes in Crystalline Materials
<br /> Experimental Considerations
<br /> Characterization of Thin–Film Photovoltaic Materials
<br /> Conclusions
<br />
<br /> SOFT X–RAY AND ELECTRON SPECTROSCOPY: A UNIQUE "TOOL CHEST" TO CHARACTERIZE THE CHEMICAL AND ELECTRONIC PROPERTIES OF SURFACES AND INTERFACES
<br /> Introduction
<br /> Charact